An alternative interpretation of hot electron interface degradation in NMOSFETs: isotope results irreconcilable with major defect generation by holes?

✍ Scribed by Hess, K.; Jinju Lee; Zhi Chen; Lyding, J.W.; Young-Kwang Kim; Bong-Seok Kim; Yong-Hee Lee; Young-Wug Kim; Kwang-Pyuk Suh

• Book ID: 114537884
• Publisher: IEEE
• Year: 1999
• Tongue: English
• Weight: 68 KB
• Volume: 46
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.784195