✦ LIBER ✦
An alternate and simpler method for finding the field-dependent defect density of SiO2 films using MOS capacitor devices
✍ Scribed by R.K. Bhan; P.C. Mathur
- Publisher
- Elsevier Science
- Year
- 1994
- Tongue
- English
- Weight
- 245 KB
- Volume
- 34
- Category
- Article
- ISSN
- 0026-2714
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