An AES study of the room-temperature oxi
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M. Clement; J. M. Sanz; J. M. Martínez-Duart
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Article
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1990
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John Wiley and Sons
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English
⚖ 566 KB
## Abstract Tantalum silicide films of ∼200 nm thick and composition TaSi~2~ were obtained by co‐sputtering in a Varian 3120 S‐gun magnetron system. The films were then introduced in an AES spectrometer and bombarded with Ar^+^ ions of different energies in order to obtain surfaces of different com