𝔖 Bobbio Scriptorium
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An AES and RBS characterization of tantalum silicide layers on GaAs: sputtering and annealing effects

✍ Scribed by M Clement; JM Sanz; A Climent; JM Martínez-Duart


Publisher
Elsevier Science
Year
1989
Tongue
English
Weight
284 KB
Volume
39
Category
Article
ISSN
0042-207X

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