An Accurate Capacitance–Voltage Measurement Method for Highly Leaky Devices—Part II

✍ Scribed by Wang, Y.; Cheung, K.P.; Choi, R.; Lee, B.-H.

• Book ID: 114619517
• Publisher: IEEE
• Year: 2008
• Tongue: English
• Weight: 577 KB
• Volume: 55
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2008.927659