An accurate and analytic threshold-voltage model for small-geometry MOSFETs with single-channel ion implantation in VLSI

✍ Scribed by Ching-Yuan Wu; Gwo-Sheng Huang; Hsing-Hai Chen; Fang-Churng Tseng; Chih-Tay Shih

• Publisher: Elsevier Science
• Year: 1985
• Tongue: English
• Weight: 652 KB
• Volume: 28
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/0038-1101(85)90052-8