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[American Institute of Aeronautics and Astronautics 20th AIAA Advanced Measurement and Ground Testing Technology Conference - Albuquerque,NM,U.S.A. (15 June 1998 - 18 June 1998)] 20th AIAA Advanced Measurement and Ground Testing Technology Conference - Uncertainty analysis of the liquid crystal coating shear vector measurement technique

✍ Scribed by Wilder, M.; Reda, D.

Book ID: 121045613
Publisher: American Institute of Aeronautics and Astronautics
Year: 1998
Weight: 828 KB
Category: Article
DOI: 10.2514/6.1998-2717

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