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Alternative mechanism for misfit dislocation generation during high-temperature Ge(Si)/Si (001) island growth

✍ Scribed by Zou, J.; Liao, X. Z.; Cockayne, D. J. H.; Jiang, Z. M.


Book ID
120167275
Publisher
American Institute of Physics
Year
2002
Tongue
English
Weight
489 KB
Volume
81
Category
Article
ISSN
0003-6951

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