Alternating current scanning electrochemical microscopy (AC-SECM) studies on the surface of electrochemically polished NiTi shape memory alloys
✍ Scribed by S. Belger; A. Schulte; C. Hessing; M. Pohl; W. Schuhmann
- Publisher
- John Wiley and Sons
- Year
- 2004
- Tongue
- English
- Weight
- 125 KB
- Volume
- 35
- Category
- Article
- ISSN
- 0933-5137
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✦ Synopsis
Abstract
Aiming at imaging local differences in electrochemical activity and related corrosion effects, the surface of electropolished NiTi was investigated using alternating current scanning electrochemical microscopy (AC‐SECM). Segregation‐related spatial variations in the rates of the anodic dissolution that are responsible for the formation of wavy surfaces during electropolishing could not be identified with AC‐SECM. Instead, the surface appeared rather uniform and did not reflect any (patterned) corrosion activity. Obviously, the anodically grown oxide film is highly isolating and passivating. This rationalizes the absence of the evolution of surface irregularities at the solid/liquid interface of NiTi‐shape‐memory alloys.