Alteration of diffusion profiles in semiconductors due to p-n junctions: P.J. Anthony Solid St. Electron., 25 (12), 1171 (1982)

• Publisher: Elsevier Science
• Year: 1986
• Tongue: English
• Weight: 74 KB
• Volume: 17
• Category: Article
• ISSN: 0026-2692
• DOI: 10.1016/s0026-2692(86)80117-3