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AlSixNy as an embedded layer for attenuated phase-shifting mask in 193 nm and the utilization of a chemically amplified negative resist NEB-22 for maskmaking

✍ Scribed by Wen-an Loong; Cheng-ming Lin


Publisher
Elsevier Science
Year
2000
Tongue
English
Weight
342 KB
Volume
53
Category
Article
ISSN
0167-9317

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