Alpha-particle-induced charge collection measurements and the effectiveness of a novel p-well protection barrier on VLSI memories

✍ Scribed by Sai-Wai Fu; Mohsen, A.M.; May, T.C.

• Book ID: 114595034
• Publisher: IEEE
• Year: 1985
• Tongue: English
• Weight: 511 KB
• Volume: 32
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/t-ed.1985.21908