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Alloying and Strain Relaxation in SiGe Islands Grown on Pit-Patterned Si(001) Substrates Probed by Nanotomography
✍ Scribed by F. Pezzoli; M. Stoffel; T. Merdzhanova; A. Rastelli; O. G. Schmidt
- Book ID
- 107470488
- Publisher
- Springer-Verlag
- Year
- 2009
- Tongue
- English
- Weight
- 318 KB
- Volume
- 4
- Category
- Article
- ISSN
- 1931-7573
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