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All-semiconductor room-temperature terahertz time domain spectrometer

✍ Scribed by Mihoubi, Zakaria; Wilcox, Keith G.; Elsmere, Stephen; Quarterman, Adrian; Rungsawang, Rakchanok; Farrer, Ian; Beere, Harvey E.; Ritchie, David A.; Tropper, Anne; Apostolopoulos, Vasileios


Book ID
115431046
Publisher
Optical Society of America
Year
2008
Tongue
English
Weight
330 KB
Volume
33
Category
Article
ISSN
0146-9592

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An etalon-based method for frequency cal
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We present an etalon-based method of calibrating the frequency of terahertz time-domain spectrometers (THz TDS). The method utilizes the etalon effect produced by multiple reflections in non-absorbing wafers or in narrow air-gaps. The technique provides frequency calibration across the measurement b