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Alignment of grain orientation in polycrystalline-SiO2 films induced by high-energy heavy ions

✍ Scribed by N.S. Shinde; N. Matsunami; T. Shimura; M. Sataka; S. Okayasu; T. Kato; M. Tazawa

Publisher: Elsevier Science
Year: 2006
Tongue: English
Weight: 331 KB
Volume: 245
Category: Article
ISSN: 0168-583X
DOI: 10.1016/j.nimb.2005.11.107

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