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Algorithm for Determining Worst Case Transistor Parameters

✍ Scribed by Long, David M.; Jaffe, Richard C.; Casey, Richard H.

Book ID: 114663100
Publisher: IEEE
Year: 1984
Tongue: English
Weight: 835 KB
Volume: 31
Category: Article
ISSN: 0018-9499
DOI: 10.1109/tns.1984.4333560

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