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Al and Si K absorption edges of Al2SiO5 polymorphs using the new YB66 soft X-ray monochromator

✍ Scribed by M. Fröba; Joe Wong; M. Rowen; G.E. Brown Jr.; T. Tanaka; Z. Rek


Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
138 KB
Volume
208-209
Category
Article
ISSN
0921-4526

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