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[AIP NUMERICAL ANALYSIS AND APPLIED MATHEMATICS: International Conference on Numerical Analysis and Applied Mathematics 2009: Volume 1 and Volume 2 - Rethymno, Crete (Greece) (18–22 September 2009)] AIP Conference Proceedings - Numerical Computation of Secondary Electron Emission Yield by a Two-Fluxes Method

✍ Scribed by Aoufi, A.; Damamme, G.; Simos, Theodore E.; Psihoyios, George; Tsitouras, Ch.

Book ID: 120920125
Publisher: AIP
Year: 2009
Weight: 993 KB
Category: Article
DOI: 10.1063/1.3241429

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