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AIP Conference Proceedings [AIP X-RAY OPTICS AND MICROANALYSIS: Proceedings of the 20th International Congress - Karlsruhe (Germany) (15–18 September 2009)] - 2D grating simulation for X-ray phase-contrast and dark-field imaging with a Talbot interferometer

✍ Scribed by Zanette, Irene; David, Christian; Rutishauser, Simon; Weitkamp, Timm; Denecke, Melissa; Walker, Clive T.


Book ID
111906524
Publisher
AIP
Year
2010
Weight
1015 KB
Volume
0
Category
Article

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