AIP Conference Proceedings [AIP 20TH INTERNATIONAL CONFERENCE ON SPECTRAL LINE SHAPES - St. John’s, (Canada) (6–11 June 2010)] - X-ray Diffraction Spectra in Cu-Implanted SiO[sub 2] Films on Si(100) Substrates

✍ Scribed by Shirokoff, J.; Lewis, J. Courtenay; Lewis, John; Predoi-Cross, Adriana

• Book ID: 120615567
• Publisher: AIP
• Year: 2010
• Weight: 769 KB
• Category: Article
• DOI: 10.1063/1.3517573