Ageing tests on microwave integrated circuits : W. Goedbloed, H. Hieber and A. G. Van Nie. Radio electron. Engr 48, (1/2) 13

• Book ID: 103274505
• Publisher: Elsevier Science
• Year: 1978
• Tongue: English
• Weight: 132 KB
• Volume: 17
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(78)90985-x