AFM studies of a new type of radiation defect on mica surfaces caused by highly charged ion impact

✍ Scribed by C. Ruehlicke; M.A. Briere; D. Schneider

• Book ID: 113286499
• Publisher: Elsevier Science
• Year: 1995
• Tongue: English
• Weight: 328 KB
• Volume: 99
• Category: Article
• ISSN: 0168-583X
• DOI: 10.1016/0168-583x(95)00308-8