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AFM investigation of thin post-baked photoresistive films for microsystem technology application

✍ Scribed by S. E. Alexandrov; A. B. Speshilova; Y. V. Soloviev; O. I. Ermeychik


Book ID
111443766
Publisher
Springer
Year
2007
Tongue
English
Weight
184 KB
Volume
41
Category
Article
ISSN
1063-7826

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