AFM investigation of bismuth doped silicate glasses
✍ Scribed by R Czajka; K Trzebiatowski; W Polewsk; B Kościelsk; S Kaszczyszyn; B Susla
- Publisher
- Elsevier Science
- Year
- 1997
- Tongue
- English
- Weight
- 511 KB
- Volume
- 48
- Category
- Article
- ISSN
- 0042-207X
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✦ Synopsis
Bismuth doped glasses were reduced in hydrogen atmosphere at temperatures above 250°C. This process leads to changes in stoichiometry of the glass in the region close to the glass surface. Relatively high surface conductivity of IOm6S allows this material to be applied to channeltron production. AFM investigations of freshly cleaved bismuth dopedglasses were done in constantand friction force modes. The AFM topographical images show the presence of different concentrations of nanocrystals vs distance from the glass surface.
Atomic resolution images obtained in both modes of these nanocrystals, together with XRD data, suggest that they are composed of bismuth.
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