✦ LIBER ✦
AFM Force−Distance Curve Methods for Measuring the Kinetics of Silicon Chemical Etching and Reactions between Silylating Agents and a Silicon Surface
✍ Scribed by Grinevich, Oleg; Mejiritski, Alexander; Neckers, D. C.
- Book ID
- 126907047
- Publisher
- American Chemical Society
- Year
- 1999
- Tongue
- English
- Weight
- 166 KB
- Volume
- 15
- Category
- Article
- ISSN
- 0743-7463
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