✦ LIBER ✦
AFM, ellipsometry, XPS and TEM on ultra-thin oxide/polymer nanocomposite layers in organic thin film transistors
✍ Scribed by A. Fian; A. Haase; B. Stadlober; G. Jakopic; N. B. Matsko; W. Grogger; G. Leising
- Book ID
- 105891264
- Publisher
- Springer
- Year
- 2007
- Tongue
- English
- Weight
- 378 KB
- Volume
- 390
- Category
- Article
- ISSN
- 1618-2650
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