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AFM-based fabrication of lateral single-electron tunneling structures for elevated temperature operation

✍ Scribed by L. Montelius; T. Junno; S.-B. Carlsson; L. Samuelson


Book ID
104306272
Publisher
Elsevier Science
Year
1997
Tongue
English
Weight
238 KB
Volume
35
Category
Article
ISSN
0167-9317

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✦ Synopsis


In this paper we will report a method that allows controlled positioning of individual nanoparticles between e-beam defined metal electrodes using AFM technique, having not only the imaging capability in the AFM for inspection of the positioning, but also in-situ electrical monitoring of the assembly procedure. This means that an electrical signal is recorded when an electrical link between the lateral metal electrodes, via the positioned particles, is established.