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AFM and XPS study of nitrided TiO2 and SiO2–TiO2 sol–gel derived films

✍ Scribed by L. Wicikowski; B. Kusz; L. Murawski; B. Susła; K. Szaniawska

Book ID: 108390516
Publisher: Elsevier Science
Year: 1999
Tongue: English
Weight: 375 KB
Volume: 54
Category: Article
ISSN: 0042-207X
DOI: 10.1016/s0042-207x(98)00468-0

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