✦ LIBER ✦
AES sputter depth profiles applied to interface analysis of GaInAs/InP grown by atmospheric pressure MOCVD
✍ Scribed by Jonder Morais; Aldionso M. Machado; Marco A. Sacilotti; Richard Landers
- Publisher
- Elsevier Science
- Year
- 1990
- Tongue
- English
- Weight
- 233 KB
- Volume
- 44
- Category
- Article
- ISSN
- 0169-4332
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