AES, LEELS and XPS studies on the interface formation between layered semiconductors GaSe and InSe

✍ Scribed by N. Nakayama; T. Kuramachi; T. Tanbo; H. Ueba; C. Tatsuyama

• Book ID: 104197600
• Publisher: Elsevier Science
• Year: 1991
• Weight: 143 KB
• Volume: 244
• Category: Article
• ISSN: 0167-2584
• DOI: 10.1016/0167-2584(91)90733-8