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AES and SIMS analyses of a low-resistance ohmic contact layer of GaP

✍ Scribed by Fujia Zhang; Baosheng Sang; Baojun Li

Publisher: Elsevier Science
Year: 1994
Tongue: English
Weight: 279 KB
Volume: 78
Category: Article
ISSN: 0169-4332
DOI: 10.1016/0169-4332(94)90033-7

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