Advantages of collocation methods over finite differences in one-dimensional Monte Carlo simulations of submicron devices

✍ Scribed by Ravaioli, U.; Lugli, P.; Osman, M.A.; Ferry, D.K.

• Book ID: 114595303
• Publisher: IEEE
• Year: 1985
• Tongue: English
• Weight: 532 KB
• Volume: 32
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/t-ed.1985.22245