Content:
Front Matter....Pages i-xvii
Accuracy in Angle and Intensity Measurements in X-Ray Powder Diffraction....Pages 1-10
Precision Lattice Parameter Measurements with Guinier Camera and Counter Diffractometer: Comparison and Reconciliation of Results....Pages 11-24
Effects of Diffractometer Alignment and Aberrations on Peak Positions and Intensities....Pages 25-33
Accuracy and Precision of Intensities in X-Ray Polycrystalline Diffraction....Pages 35-44
New Standard Reference Materials for X-Ray Powder Diffraction....Pages 45-51
Precision and Reproducibility of Lattice Parameters from Guinier Powder Patterns: Follow-Up and Assessment....Pages 53-62
Powder-Pattern: A System of Programs for Processing and Interpreting Powder Diffraction Data....Pages 63-72
An Evaluation of Some Profile Models and the Optimization Procedures Used in Profile Fitting....Pages 73-80
Computer-Aided Qualitative X-Ray Powder Diffraction Phase Analysis....Pages 81-86
The JCPDS Data Base โ Present and Future....Pages 87-88
Search/Match Implications of the Frequency Distribution of โdโ Values in the JCPDS Powder Data File....Pages 89-92
Computer Search/Match of Standards Containing a Small Number of Reflections....Pages 93-98
Comparison of the Hanawalt and Johnson-Vand Computer Search/Match Strategies....Pages 99-104
A Comparison of Methods for Reducing Preferred Orientation....Pages 105-110
The Dramatic Effect of Crystallite Size on X-Ray Intensities....Pages 111-117
X-Ray Diffraction Intensity of Oxide Solid Solutions: Application to Qualitative and Quantitative Phase Analysis....Pages 119-128
Quantitative Analysis of Plate like Pigments by X-Ray Diffraction....Pages 129-135
Preparation and Certification of Standard Reference Materials to Be Used In the Determination of Retained Austenite in Steels....Pages 137-140
Profile Fitting for Quantitative Analysis in X-Ray Powder Diffraction....Pages 141-147
XRD Quantitative Phase Analysis Using the NBSQUANT82 System*....Pages 149-156
SCRIP - Fortran IV Software for Quantitative XRD....Pages 157-162
An X-Ray Diffraction Study of CaNi5 Hydrides Using in SITU Hydriding and Profile Fitting Methods....Pages 163-170
The Measurement of Thermally Induced Structural Changes by High Temperature (900ยฐC) Guinier X-Ray Powder Diffraction Techniques....Pages 171-180
The Use of X-Ray Diffraction and Infrared Spectroscopy to Characterize Hazardous Wastes....Pages 181-184
Comparison of X-Ray Powder Diffraction Techniques....Pages 185-187
The Use of Multi-Scan Diffraction in Phase Identification....Pages 189-196
An Automated X-Ray Diffractometer for Detection and Identification of Minor Phases....Pages 197-204
Time Share Computer Capability for Phase Identification by X-Ray Diffraction....Pages 205-208
The Use of Mn-Ka X-Rays and a New Model of PSPC in Stress Analysis of Stainless Steel....Pages 209-216
Measurement of Stress Gradients by X-Ray Diffraction....Pages 217-224
A Method for X-Ray Stress Analysis of Thermochemically Treated Materials....Pages 225-231
Application of a Position Sensitive Scintillation Detector for Nondestructive Residual Stress Measurements inside Stainless Steel Piping....Pages 233-243
Direct Determination of Stress in a Thin Film Deposited On a Single-Crystal Substrate from an X-Ray Topographic Image....Pages 245-253
The Determination of Elastic Constants Using a Combination of X-Ray Stress Techniques....Pages 255-258
One-Dimensional, Curved, Position-Sensitive Detector for X-Ray Diffractometry....Pages 259-267
A PHI-PSI-Diffractometer for Residual Stress Measurements....Pages 269-274
X-Ray Fractography on Fatigue Fractured Surface....Pages 275-282
X-Ray Diffraction Observation of Fracture Surfaces of Ductile Cast Iron....Pages 283-290
Analytical and Experimental Investigation of Flow and Fracture Mechanisms Induced By Indentation in Single Crystal MgO....Pages 291-298
X-Ray Diffraction Study of Shape Memory in Uranium-Niobium Alloys....Pages 299-306
X-Ray Fluorescence Analysis Using Synchrotron Radiation....Pages 307-312
Energy Resolution Measurements of Mercuric Iodide Detectors Using a Cooled Fet Preamplifier....Pages 313-323
X-Ray Polarization: Bragg Diffraction and X-Ray Fluorescence....Pages 325-330
A New Technique for Radioisotope-Excited X-Ray Fluorescence....Pages 331-336
Bragg-Borrmann X-Ray Spectroscopy from a Line Source....Pages 337-340
Automated Qualitative X-Ray Fluorescence Elemental Analysis....Pages 341-343
A New Method for Quantitative X-Ray Fluorescence Analysis of Mixtures of Oxides or Other Compounds by Empirical Parameter Methods....Pages 345-350
FPT: An Integrated Fundamental Parameters Program for Broadband EDXRF Analysis without a Set of Similar Standards....Pages 351-354
A Comparison of the XRF11 and EXACT Fundamental Parameters Programs When Using Filtered Direct and Secondary Target Excitation in EDXRF....Pages 355-368
A Generalized Matrix Correction Approach for Energy-Dispersive X-Ray Fluorescence Analysis of Paint Using Fundamental Parameters and Scattered Silver K? Peaks....Pages 369-376
Multielement Analysis of Unweighed Biological and Geological Samples Using Backscatter and Fundamental Parameters....Pages 377-384
A Correction Method for Absorption in the Analysis of Aerosols by EDX Spectrometry....Pages 385-390
XRF Analysis by Combining the Standard Addition Method with Matrix-Correction Models....Pages 391-394
Accurate Geochemical Analysis of Samples of Unknown Composition....Pages 395-400
XRF Analysis of Vegetation Samples and Its Application to Mineral Exploration....Pages 401-407
Determination of Boron Oxide in Glass by X-Ray Fluorescence Analysis....Pages 409-414
Measurement of Composition and Thickness for Single Layer Coating with Energy Dispersive XRF Analysis....Pages 415-421
Determination of Light Elements on the Chem-X Multichannel Spectrometer....Pages 423-430
Simultaneous Determination of 36 Elements by X-Ray Fluorescence Spectrometry as a Prospecting Tool....Pages 431-436
Elemental Analysis of Geological Samples Using a Multichannel, Simultaneous X-Ray Spectrometer....Pages 437-442
Chemical Analysis of Coal by Energy Dispersive X-Ray Fluorescence Utilizing Artificial Standards....Pages 443-450
Back Matter....Pages 451-456
....Pages 457-466