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Advances in X-ray analysis, vol. 25: John C. Russ, Charles S. Barrett Paul K. Bredecki and Donald Leyden (editors). Proceedings of the 30th annual conference on applications of X-ray analysis held in Denver, Colo., August 3–7, 1981. Plenum Press, New York, N.Y., xviii + 398 pp., US $49.50 (hardcover)

✍ Scribed by Bjorn O. Mysen


Book ID
115813880
Publisher
Elsevier Science
Year
1985
Tongue
English
Weight
172 KB
Volume
49
Category
Article
ISSN
0009-2541

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