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Advances in X-Ray Analysis || The Characterisation of Microtexture by Orientation Mapping

✍ Scribed by Predecki, Paul K.; Bowen, D. Keith; Gilfrich, John V.; Goldsmith, Charles C.; Huang, Ting C.; Jenkins, Ron; Noyan, I. Cev; Smith, Deane K.

Book ID: 120332115
Publisher: Springer US
Year: 1995
Weight: 611 KB
Category: Article
ISBN: 1461517974
DOI: 10.1007/978-1-4615-1797-9_63

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