𝔖 Bobbio Scriptorium
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Advances in second-order calibration

✍ Scribed by Yongdong Wang; Odd S. Borgen; Bruce R. Kowalski; Ming Gu; Frantisek Turecek

Publisher
John Wiley and Sons
Year
1993
Tongue
English
Weight
784 KB
Volume
7
Category
Article
ISSN
0886-9383

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πŸ“œ SIMILAR VOLUMES

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## Abstract Techniques used to assist phase matching of second‐order nonlinearities in semiconductor waveguides are reviewed. The salient points of each method are highlighted, with their strengths and weaknesses with regard to various key applications discussed. Recent progress in these techniques