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Advances in, and applications of, X-ray photoelectron spectroscopy (ESCA) in mineralogy and geochemistry

✍ Scribed by G.M. Bancroft; J.R. Brown; W.S. Fyfe

Book ID
115813413
Publisher
Elsevier Science
Year
1979
Tongue
English
Weight
850 KB
Volume
25
Category
Article
ISSN
0009-2541

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A review of the applications of total reflection x-ray photoelectron spectroscopy (TRXPS) to the semiconductor surface are described. When the grazing angle of incident x-rays is below the critical angle of x-ray total reflection, the penetration depth of the x-rays into the material is strongly att