Advanced model and analysis of series resistance for CMOS scaling into nanometer regime. II. Quantitative analysis

✍ Scribed by Seong-Dong Kim; Cheol-Min Park; Woo, J.C.S.

• Book ID: 114539023
• Publisher: IEEE
• Year: 2002
• Tongue: English
• Weight: 204 KB
• Volume: 49
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.987118