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Advanced Calculations for Defects in Materials (Electronic Structure Methods) || Time-Dependent Density Functional Study on the Excitation Spectrum of Point Defects in Semiconductors

✍ Scribed by Alkauskas, Audrius; Deák, Peter; Neugebauer, Jörg; Pasquarello, Alfredo; Van de Walle, Chris G.


Book ID
118738320
Publisher
Wiley-VCH Verlag GmbH & Co. KGaA
Year
2011
Weight
197 KB
Category
Article
ISBN
3527410244

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