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Admittance of measuring cell with a dielectric sample

โœ Scribed by V. F. Matveichuk


Book ID
104981209
Publisher
Springer US
Year
1987
Tongue
English
Weight
256 KB
Volume
30
Category
Article
ISSN
0543-1972

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Admittance and dielectric spectroscopy o
โœ Paulo R. Bueno; Josรฉ A. Varela; Elson Longo ๐Ÿ“‚ Article ๐Ÿ“… 2007 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 713 KB

This text discusses about advantageous, powerful and limitations of admittance and dielectric spectroscopy in the characterization of polycrystalline semiconductors. In the context of polycrystalline semiconductors or dielectric materials, the admittance or dielectric frequency response analyses are