✦ LIBER ✦
Admittance characteristics of au/p-si schottky diode with damage induced by reactive ion etching
✍ Scribed by Akira Asai; Tadashi Ohachi; Ichiro Taniguchi
- Book ID
- 112078777
- Publisher
- John Wiley and Sons
- Year
- 1993
- Tongue
- English
- Weight
- 622 KB
- Volume
- 76
- Category
- Article
- ISSN
- 8756-663X
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