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Admittance analysis of an MIS structure made with PECVD deposited a-SiNx:H thin films

✍ Scribed by İsmail Atilgan; Serhat Özder; Orhan Özdemir; Bayram Katircioğlu


Book ID
117149883
Publisher
Elsevier Science
Year
1999
Tongue
English
Weight
302 KB
Volume
249
Category
Article
ISSN
0022-3093

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