Adhesion strength of Ni film on Ti substrate characterized by three-point bend test, peel test and theoretic calculation

✍ Scribed by F.Z. Ren; P. Liu; S.G. Jia; B.H. Tian; J.H. Su

• Publisher: Elsevier Science
• Year: 2006
• Tongue: English
• Weight: 185 KB
• Volume: 419
• Category: Article
• ISSN: 0921-5093
• DOI: 10.1016/j.msea.2005.12.024