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Adaptive Fault Diagnosis of Analog Circuits by Operation-Region Model andX–YZoning Method

✍ Scribed by Yukiya Miura; Jiro Kato

Publisher: Springer US
Year: 2008
Tongue: English
Weight: 600 KB
Volume: 24
Category: Article
ISSN: 0923-8174
DOI: 10.1007/s10836-007-5022-6

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## Abstract This paper proposes a fault diagnostic method for analog circuits that combines an X‐Y zoning method and an operation‐region model. An X‐Y zoning method is a test method to detect faults of analog circuits by using the relationship between circuit inputs and outputs. An operation‐region