Adaptive analysis of yield line patterns in plates with the arbitrary Lagrangian–Eulerian method
✍ Scribed by H. Askes; A. Rodrı́guez-Ferran; A. Huerta
- Publisher
- Elsevier Science
- Year
- 1999
- Tongue
- English
- Weight
- 1015 KB
- Volume
- 70
- Category
- Article
- ISSN
- 0045-7949
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✦ Synopsis
Plasticity models provide suitable tools to describe the so-called yield line pattern that occurs with the failure of plates. However, in a Lagrangian description a huge number of ®nite elements are needed for accurate solutions. Accuracy can be combined with low computer costs by means of the arbitrary Lagrangian±Eulerian (ALE) method. With the ALE method, the ®nite element mesh is automatically re®ned in the yield lines. A new remesh indicator is proposed that captures newly appearing yield lines as well as already formed yield lines. Numerical examples show the eectiveness of this approach.