✦ LIBER ✦
Activation Energies of Thermal Annealing of Radiation-Induced Damage in n- and p-channels of CMOS Integrated Circuits, Part II
✍ Scribed by Danchenko, Vitaly; Fang, P. H.; Brashears, Sidney S.
- Book ID
- 114662280
- Publisher
- IEEE
- Year
- 1981
- Tongue
- English
- Weight
- 1014 KB
- Volume
- 28
- Category
- Article
- ISSN
- 0018-9499
No coin nor oath required. For personal study only.