Wavelet packet denoising robust regressi
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Hu-Wei Tan
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Article
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1999
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John Wiley and Sons
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English
β 107 KB
Fluctuation in characteristic parameters of the equivalent circuit for a thickness-shear-mode (TSM) acoustic wave sensor is a troublesome problem encountered in their practical applications. This fluctuation is due to interference from normal and non-normal noise of the impedance analyser. In this p