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[ACM Press the International Conference - San Jose, California (2012.11.05-2012.11.08)] Proceedings of the International Conference on Computer-Aided Design - ICCAD '12 - Circuit reliability

✍ Scribed by Fang, Jianxin; Gupta, Saket; Kumar, Sanjay V.; Marella, Sravan K.; Mishra, Vivek; Zhou, Pingqiang; Sapatnekar, Sachin S.

Book ID: 125509504
Publisher: ACM Press
Year: 2012
Weight: 743 KB
Category: Article
ISBN: 1450315739
DOI: 10.1145/2429384.2429431

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