[ACM Press the 42nd annual conference - San Diego, California, USA (2005.06.13-2005.06.17)] Proceedings of the 42nd annual conference on Design automation - DAC '05 - Path delay test compaction with process variation tolerance
โ Scribed by Kajihara, Seiji; Fukunaga, Masayasu; Wen, Xiaoqing; Maeda, Toshiyuki; Hamada, Shuji; Sato, Yasuo
- Book ID
- 121007522
- Publisher
- ACM Press
- Year
- 2005
- Weight
- 288 KB
- Category
- Article
- ISBN-13
- 9781595930583
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