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[ACM Press the 36th ACM/IEEE conference - New Orleans, Louisiana, United States (1999.06.21-1999.06.25)] Proceedings of the 36th ACM/IEEE conference on Design automation conference - DAC '99 - A study in coverage-driven test generation

✍ Scribed by Benjamin, Mike; Geist, Daniel; Hartman, Alan; Mas, Gerard; Smeets, Ralph; Wolfsthal, Yaron

Book ID: 121479692
Publisher: ACM Press
Year: 1999
Weight: 65 KB
Category: Article
DOI: 10.1145/309847.310108

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